ASTM E2444-05
- standard by ASTM International, 05/01/2005
- Terminology Relating to Measurements Taken on Thin, Reflecting Films
- Category: ASTM
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Full Description
1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.
1.2 The terms are listed in alphabetical order.
Product Details
- Published:
- 05/01/2005
- Number of Pages:
- 3
- File Size:
- 1 file , 110 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Document History
