ASTM F108-88e1
- standard by ASTM International, 01/01/1988
- Test Method for Resistivity of Silicon Epitaxial Layers by the Three-Probe Voltage Breakdown Method (Withdrawn 1993)
- Category: ASTM
$64.00
$32.00
Product Details
- Published:
- 01/01/1988
- Number of Pages:
- 6
- File Size:
- 1 file , 140 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
